Mutation Testing Author

Name: Yves Le Traon
Affiliation: IRISA
Email: Yves.Le-Traon@irisa.fr
Webpage: http://www.irisa.fr/triskell/perso_pro/yletraon/
1Mike Papadakis and Marinos Kintis and Jie Zhang and Yue Jia and Yves Le Traon and Mark Harman
Mutation Testing Advances: An Analysis and Survey
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2Thierry Titcheu Chekam and Mike Papadakis and Yves Le Traon and Mark Harman
An empirical study on mutation, statement and branch coverage fault revelation that avoids the unreliable clean program assumption
Proceedings of the 39th International Conference on Software Engineering, {ICSE} 2017, Buenos Aires, Argentina, May 20-28, 2017, 2017.
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3Mike Papadakis and Christopher Henard and Mark Harman and Yue Jia and Yves Le Traon
Threats to the validity of mutation-based test assessment
Proceedings of the 25th International Symposium on Software Testing and Analysis, {ISSTA} 2016, Saarbr{\"{u}}cken, Germany, July 18-20, 2016, 2016.
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4Thomas Laurent and Anthony Ventresque and Mike Papadakis and Christopher Henard and Yves Le Traon
Assessing and Improving the Mutation Testing Practice of {PIT}
CoRR, abs/1601.02351(), 2016.
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5Christopher Henard and Mike Papadakis and Mark Harman and Yue Jia and Yves Le Traon
Comparing white-box and black-box test prioritization
Proceedings of the 38th International Conference on Software Engineering, {ICSE} 2016, Austin, TX, USA, May 14-22, 2016, 2016.
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6Thierry Titcheu Chekam and Mike Papadakis and Yves Le Traon
Assessing and Comparing Mutation-based Fault Localization Techniques
CoRR, abs/1607.05512(), 2016.
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7Francisco Carlos M. Souza and Mike Papadakis and Yves Le Traon and M{\'{a}}rcio Eduardo Delamaro
Strong mutation-based test data generation using hill climbing
Proceedings of the 9th International Workshop on Search-Based Software Testing, SBST@ICSE 2016, Austin, Texas, USA, May 14-22, 2016, 2016.
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8Mike Papadakis and Yves Le Traon
Metallaxis-FL: mutation-based fault localization
Softw. Test., Verif. Reliab., 25(), 2015.
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9S{\'{e}}bastien Bardin and Micka{\"{e}}l Delahaye and Robin David and Nikolai Kosmatov and Mike Papadakis and Yves Le Traon and Jean{-}Yves Marion
Sound and Quasi-Complete Detection of Infeasible Test Requirements
8th {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2015, Graz, Austria, April 13-17, 2015, 2015.
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10Mike Papadakis and Yue Jia and Mark Harman and Yves Le Traon
Trivial Compiler Equivalence: {A} Large Scale Empirical Study of a Simple, Fast and Effective Equivalent Mutant Detection Technique
37th {IEEE/ACM} International Conference on Software Engineering, {ICSE} 2015, Florence, Italy, May 16-24, 2015, Volume 1, 2015.
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11Mike Papadakis and M{\'{a}}rcio Eduardo Delamaro and Yves Le Traon
Mitigating the effects of equivalent mutants with mutant classification strategies
Sci. Comput. Program., 95(), 2014.
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12Mike Papadakis and Yves Le Traon
Effective fault localization via mutation analysis: a selective mutation approach
Symposium on Applied Computing, {SAC} 2014, Gyeongju, Republic of Korea - March 24 - 28, 2014, 2014.
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13Mike Papadakis and Christopher Henard and Yves Le Traon
Sampling Program Inputs with Mutation Analysis: Going Beyond Combinatorial Interaction Testing
Seventh {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2014, March 31 2014-April 4, 2014, Cleveland, Ohio, {USA}, 2014.
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14Christopher Henard and Mike Papadakis and Yves Le Traon
Mutation-Based Generation of Software Product Line Test Configurations
Search-Based Software Engineering - 6th International Symposium, {SSBSE} 2014, Fortaleza, Brazil, August 26-29, 2014. Proceedings, 2014.
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15Christopher Henard and Mike Papadakis and Yves Le Traon
MutaLog: {A} Tool for Mutating Logic Formulas
Seventh {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2014 Workshops Proceedings, March 31 - April 4, 2014, Cleveland, Ohio, {USA}, 2014.
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16Christopher Henard and Mike Papadakis and Gilles Perrouin and Jacques Klein and Yves Le Traon
Towards automated testing and fixing of re-engineered feature models
35th International Conference on Software Engineering, {ICSE} '13, San Francisco, CA, USA, May 18-26, 2013, 2013.
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17Christopher Henard and Mike Papadakis and Gilles Perrouin and Jacques Klein and Yves Le Traon
Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing
Sixth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2013 Workshops Proceedings, Luxembourg, Luxembourg, March 18-22, 2013, 2013.
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18Mike Papadakis and M{\'{a}}rcio Eduardo Delamaro and Yves Le Traon
Proteum/FL: {A} tool for localizing faults using mutation analysis
13th {IEEE} International Working Conference on Source Code Analysis and Manipulation, {SCAM} 2013, Eindhoven, Netherlands, September 22-23, 2013, 2013.
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19Mike Papadakis and Yves Le Traon
Mutation testing strategies using mutant classification
Proceedings of the 28th Annual {ACM} Symposium on Applied Computing, {SAC} '13, Coimbra, Portugal, March 18-22, 2013, 2013.
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20Yehia Elrakaiby and Tejeddine Mouelhi and Yves Le Traon
Testing Obligation Policy Enforcement Using Mutation Analysis
Fifth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2012, Montreal, QC, Canada, April 17-21, 2012, 2012.
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21JeeHyun Hwang and Tao Xie and Donia El Kateb and Tejeddine Mouelhi and Yves Le Traon
Selection of regression system tests for security policy evolution
{IEEE/ACM} International Conference on Automated Software Engineering, ASE'12, Essen, Germany, September 3-7, 2012, 2012.
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22Mike Papadakis and Yves Le Traon
Using Mutants to Locate "Unknown" Faults
Fifth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2012, Montreal, QC, Canada, April 17-21, 2012, 2012.
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23Alexandre Bartel and Benoit Baudry and Freddy Munoz and Jacques Klein and Tejeddine Mouelhi and Yves Le Traon
Model Driven Mutation Applied to Adaptative Systems Testing
Fourth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2011 Workshops Proceedings, March 21 - March 25, 2011, Berlin, Germany, 2011.
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24Romain Delamare and Benoit Baudry and Sudipto Ghosh and Yves Le Traon
A Test-Driven Approach to Developing Pointcut Descriptors in AspectJ
Proceedings of the 2nd International Conference on Software Testing Verification and Validation (ICST'09)Davor Colorado, 01-04 April 2009.
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25Romain Delamare and Benoit Baudry and Yves Le Traon
AjMutator: A Tool For The Mutation Analysis Of AspectJ Pointcut Descriptors
Proceedings of the 4th International Workshop on Mutation Analysis (MUTATION'09)Denver, Colorado, 1-4 April 2009.
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26Tejeddine Mouelhi and Yves Le Traon and Benoit Baudry
Transforming and Selecting Functional Test Cases for Security Policy Testing
Second International Conference on Software Testing Verification and Validation, {ICST} 2009, Denver, Colorado, USA, April 1-4, 2009, 2009.
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27Romain Delamare and Benoit Baudry and Yves Le Traon
AjMutator: {A} Tool for the Mutation Analysis of AspectJ Pointcut Descriptors
Second International Conference on Software Testing Verification and Validation, {ICST} 2009, Denver, Colorado, USA, April 1-4, 2009, Workshops Proceedings, 2009.
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28Romain Delamare and Benoit Baudry and Sudipto Ghosh and Yves Le Traon
A Test-Driven Approach to Developing Pointcut Descriptors in AspectJ
Second International Conference on Software Testing Verification and Validation, {ICST} 2009, Denver, Colorado, USA, April 1-4, 2009, 2009.
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29Tejeddine Mouelhi and Benoit Baudry and Yves Le Traon
Transforming and Selecting Functional Test Cases for Security Policy Testing
Proceedings of the 2nd International Conference on Software Testing, Verification and ValidationDenver, Colorado, 1-4 April 2009.
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30Tejeddine Mouelhi and Franck Fleurey and Benoit Baudry and Yves Le Traon
A Model-based Framework for Security Policies Specifications, Deployment and Testing
Proceedings of the 11th International Conference on Model Driven Engineering Languages and Systems (MoDELS'08)Toulouse, France, 28 September - 1 October 2008.
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31Alexander Pretschner and Tejeddine Mouelhi and Yves Le Traon
Model-Based Tests for Access Control Policies
Proceedings of the 1st International Conference on Software Testing, Verification, and Validation (ICST '08)Lillehammer, Norway, 9-11 April 2008.
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32Tejeddine Mouelhi and Franck Fleurey and Benoit Baudry and Yves Le Traon
Mutating DAC And MAC Security Policies: A Generic Metamodel Based Approach
Proceedings of the 1st International Modeling Security WorkshopToulouse, France, 28th September 2008.
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33Yves Le Traon and Tejeddine Mouelhi and Benoit Baudry
Testing Security Policies: Going Beyond Functional Testing
The 18th IEEE International Symposium on Software ReliabilityTrollh\"attan, Sweden, 5-9 November 2007.
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34Tejeddine Mouelhi and Yves Le Traon and Benoit Baudry
Mutation Analysis for Security Tests Qualification
Proceedings of the 3rd Workshop on Mutation Analysis (MUTATION'07)Windsor, UK, 10-14 September 2007.
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35Benoit Baudry and Franck Fleurey and Yves Le Traon
Improving Test Suites for Efficient Fault Localization
Proceedings of the 28th International Conference on Software Engineering (ICSE'06)Shanghai, China, 20-28 May 2006.
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36Jean-Marie Mottu and Benoit Baudry and Yves Le Traon
Mutation Analysis Testing for Model Transformations
Proceedings of the 2nd European Conference on Model Driven Architecture - Foundations and ApplicationsBilbao, Spain, July 2006.
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37Yves Le Traon and Benoit Baudry and Jean-Marc J\'ez\'equel
Design by Contract to Improve Software Vigilance
IEEE Transactions of Software Engineering, 32(8), August 2006.
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38Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon
From Genetic to Bacteriological Algorithms for Mutation-based Testing
Software Testing, Verification and Reliability, 15(2), June 2005.
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39Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon
Automatic Test Case Optimization: A Bacteriologic Algorithm
IEEE Software, 22(2), March-April 2005.
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40Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon
Automatic Test Case Optimization Using a Bacteriological Adaptation Model: Application to .NET Components
Proceedings of the 17th IEEE International Conference on Automated Software Engineering (ASE'02)Edinburgh, Scotland, 23-27 September 2002.
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41Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon
Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment
Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)Annapolis, Maryland, 12-15 November 2002.
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42Benoit Baudry and Vu Le Hanh and Jean-Marc J\'ez\'equel and Yves Le Traon
Trustable Components: Yet Another Mutation-Based Approach
Proceedings of the 1st Workshop on Mutation Analysis (MUTATION'00)San Jose, California, 6-7 October 2001.
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